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Conclusion
- Samples can only be etched and viewed once, further attempts to etch will result in imaging problems such as gold flaking and imaging-induced damage
- Depth profiles can be constructed using parallax only for relatively large holes
- The diameter of holes increases linearly as a function of etch time
- The SEM can be used to scan an entire piece of CR-39, but factors such as total scan time decrease its appeal as a new method of scanning
